Convolutional neural network-based metal and streak artifacts reduction in dental CT images with sparse-view sampling scheme.

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Abstract

Sparse-view sampling has attracted attention for reducing the scan time and radiation dose of dental cone-beam computed tomography (CBCT). Recently, various deep learning-based image reconstruction techniques for sparse-view CT have been employed to produce high-quality image while effectively reducing streak artifacts caused by the lack of projection views. However, most of these methods do not fully consider the effects of metal implants. As sparse-view sampling strengthens the artifacts caused by metal objects, simultaneously reducing both metal and streak artifacts in sparse-view CT images has been challenging. To solve this problem, in this study, we propose a novel framework.The proposed method was based on the normalized metal artifact reduction (NMAR) method, and its performance was enhanced using two convolutional neural networks (CNNs). The first network reduced the initial artifacts while preserving the fine details to generate high-quality priors for NMAR processing. Subsequently, the second network was employed to reduce the streak artifacts after NMAR processing of sparse-view CT data. To validate the proposed method, we generated training and test data by computer simulations using both XCAT and clinical datasets.Visual inspection and quantitative evaluations demonstrated that the proposed method effectively reduced both metal and streak artifacts while preserving the details of anatomical structures compared with the conventional metal artifact reduction methods.We propose a framework for reconstructing accurate CT images in metal-inserted sparse-view CT. The proposed method reduces streak artifacts from both metal objects and sparse-view sampling while recovering the anatomical details, indicating the feasibility of fast-scan dental CBCT imaging. This article is protected by copyright. All rights reserved.This article is protected by copyright. All rights reserved.