Metrology R-DICnet: an end-to-end recursive residual refinement DIC network for larger deformation measurement. January 4, 2024
Metrology | Optics Phase retrieval for single-frame interferogram with an irregular-shaped aperture based on deep learning. November 29, 2023
Engineering | Metrology Simulation-driven machine learning approach for high-speed correction of slope-dependent error in coherence scanning interferometry. November 29, 2023
Atomic Physics | Metrology | Physics Near-infrared speckle wavemeter based on nonlinear frequency conversion. August 1, 2023
Metrology | Semiconductor imaging Robust Detection, Segmentation, and Metrology of High Bandwidth Memory 3D Scans Using an Improved Semi-Supervised Deep Learning Approach. July 8, 2023
Materials Science | Metrology | Physics Picophotonic localization metrology beyond thermal fluctuations. May 11, 2023
Image processing | Metrology | Optics Phase derivative estimation in digital holographic interferometry using a deep learning approach. April 26, 2022
Data Science | Deep Learning | Metrology Potential for improving the local realization of coordinated universal time with a convolutional neural network. January 2, 2020